SEM/STEM: Microscopy and Microanalysis Techniques

Size of different materials and structures are important to understanding how some properties and tissues are organized in their own biological or non-biological disposition. The purpose of this laboratory is to learn the basic operation of the microscope and how to acquire a secondary electron image. In this report SEM technique will be explored throughout JEOL JSM-IT100 InTouchScope™ available at Baker laboratory at ESF-SUNY. Small Au-coated beetle already placed in an SEM stub from the laboratory collection was selected for this first imaging experiment and evaluation. 3 images of the sample in 3 different regions were acquired named as image 1 (I1), image 2 (I2) and image 3 (I3). Sample preparation and placement at the sample holder and stage are divided in 4 steps as following: 1. Sample at stup after coating; 2. Sample at sample holder; 3. Sample stage preparation and 4. Sample stage placement and equipment start-up. Vaccum (0 Pa); accelerating voltage (10 kV); probe current (50); work distance(10 mm) at 180x 600x and 2500x magnification was applied as parameters to acquire the images. The image acquisition represents a key step to obtain pictures that real represent the structure that we are evaluating in the equipment. In this case the main parameters that expressed and influence the image quality was accelerating voltage at 10 kV, work distance at 10 mm and probe current at 50. However, one of the most strategies to explore and navigate into the structure was the magnification assumed in each picture.